Effect of measurement frequency on admittance characteristics in Al/p-Si structures with interfacial native oxide layer


Özdemir M. C. , SEVGİLİ Ö., ORAK İ., TURUT A.

International Journal of Chemistry and Technology, vol.3, no.2, pp.129-135, 2019 (Peer-Reviewed Journal)

  • Publication Type: Article / Article
  • Volume: 3 Issue: 2
  • Publication Date: 2019
  • Doi Number: 10.32571/ijct.642886
  • Journal Name: International Journal of Chemistry and Technology
  • Journal Indexes: TR DİZİN (ULAKBİM)
  • Page Numbers: pp.129-135