The Effect of Measurement Frequency on Dielectric Characteristics in Al/P-Si Structures with Interfacial Native Oxide Layer


Özdemir M. C. , SEVGİLİ Ö. , ORAK İ., TURUT A.

Journal of the Institute of Science and Technology, vol.10, no.1, pp.91-100, 2020 (Other Refereed National Journals)

  • Publication Type: Article / Article
  • Volume: 10 Issue: 1
  • Publication Date: 2020
  • Doi Number: 10.21597/jist.612518
  • Title of Journal : Journal of the Institute of Science and Technology
  • Page Numbers: pp.91-100