The Effect of Measurement Frequency on Dielectric Characteristics in Al/P-Si Structures with Interfacial Native Oxide Layer

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Copy For Citation

Özdemir M. C., SEVGİLİ Ö., ORAK İ., TURUT A.

Journal of the Institute of Science and Technology, vol.10, no.1, pp.91-100, 2020 (Peer-Reviewed Journal)

• Publication Type: Article / Article
• Volume: 10 Issue: 1
• Publication Date: 2020
• Doi Number: 10.21597/jist.612518
• Journal Name: Journal of the Institute of Science and Technology
• Journal Indexes: TR DİZİN (ULAKBİM)
• Page Numbers: pp.91-100
• Kütahya Health Sciences University Affiliated: No